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1

[IEEE NOMS 2018 - 2018 IEEE/IFIP Network Operations and Management Symposium - Taipei, Taiwan (2018.4.23-2018.4.27)] NOMS 2018 - 2018 IEEE/IFIP Network Operations and Management Symposium - Fingerprinting encrypted network traffic types using machine learning

Leroux, Sam, Bohez, Steven, Maenhaut, Pieter-Jan, Meheus, Nathan, Simoens, Pieter, Dhoedt, Bart

Année:

2018

Langue:

english

Fichier:

PDF, 151 KB

english, 2018

2

Learning robots to grasp by demonstration

De Coninck, Elias, Verbelen, Tim, Van Molle, Pieter, Simoens, Pieter, Dhoedt, Bart

Journal:

Robotics and Autonomous Systems

Année:

2020

Fichier:

PDF, 1.88 MB

2020

3

Computed tomography and cross-sectional anatomy of the brain in clinically normal dogs

De Rycke, Lieve M., Gielen, Ingrid M., Meervenne, Sofie A. Van, Simoens, Paul J., Bree, Henri J. van

Journal:

American Journal of Veterinary Research

Année:

2005

Langue:

english

Fichier:

PDF, 2.15 MB

english, 2005

4

(Invited) Gate-All-Around Nanowire FETs vs. Triple-Gate FinFETs: On Gate Integrity and Device Characteristics

Veloso, A., Cho, M. J., Simoen, E., Hellings, G., Matagne, P., Collaert, N., Thean, A.

Journal:

ECS Transactions

Année:

2016

Langue:

english

Fichier:

PDF, 682 KB

english, 2016

5

Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

Boudier, D., Cretu, B., Simoen, E., Carin, R., Veloso, A., Collaert, N., Thean, A.

Journal:

Solid-State Electronics

Année:

2017

Langue:

english

Fichier:

PDF, 1.43 MB

english, 2017

6

Detailed structural and electrical characterization of plated crystalline silicon solar cells

Dang, C., Labie, R., Simoen, E., Poortmans, J.

Journal:

Solar Energy Materials and Solar Cells

Année:

2018

Langue:

english

Fichier:

PDF, 4.02 MB

english, 2018

7

The Neglected Pieces of Designing Collective Decision-Making Processes

Khaluf, Yara, Simoens, Pieter, Hamann, Heiko

Journal:

Frontiers in Robotics and AI

Année:

2019

Langue:

english

Fichier:

PDF, 1.28 MB

english, 2019

8

Short-channel epitaxial germanium pMOS transistors

G. Eneman, B. De Jaeger, G. Wang, J. Mitard, G. Hellings, D.P. Brunco, E. Simoen, R. Loo, M. Caymax, C. Claeys, K. De Meyer, M. Meuris, M.M. Heyns

Journal:

Thin Solid Films

Année:

2010

Langue:

english

Fichier:

PDF, 323 KB

english, 2010

9

Impact of advanced processing modules on the low-frequency noise performance of deep-submicron CMOS technologies

C Claeys, E Simoen

Journal:

Microelectronics Reliability

Année:

2000

Langue:

english

Fichier:

PDF, 236 KB

english, 2000

10

Reliability of polycrystalline silicon thin film resistors

M. Nakabayashi, H. Ohyama, E. Simoen, M. Ikegami, C. Claeys, K. Kobayashi, M. Yoneoka, K. Miyahara

Journal:

Microelectronics Reliability

Année:

2001

Fichier:

PDF, 396 KB

2001

11

RTS noise due to lateral isolation related defects in submicron nMOSFETs

N. Lukyanchikova, M. Petrichuk, N. Garbar, E. Simoen, C. Claeys

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 306 KB

english, 1998

12

Flicker noise in deep submicron nMOS transistors

N. Lukyanchikova, N. Garbar, M. Petrichuk, E. Simoen, C. Claeys

Journal:

Solid-State Electronics

Année:

2000

Langue:

english

Fichier:

PDF, 261 KB

english, 2000

13

Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation

K. Hayama, K. Takakura, H. Ohyama, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2005

Langue:

english

Fichier:

PDF, 1.80 MB

english, 2005

14

Germanium content dependence of the leakage current of recessed SiGe source/drain junctions

Eddy Roger Simoen, Mireia Bargallo Gonzalez, Geert Eneman, Peter Verheyen, Aldo Benedetti, Hugo Bender, Roger Loo, Cor Claeys

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2007

Langue:

english

Fichier:

PDF, 255 KB

english, 2007

15

Impact of gate oxide nitridation process on 1/f noise in 0.18 μm CMOS

M Da Rold, E Simoen, S Mertens, M Schaekers, G Badenes, S Decoutere

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 287 KB

english, 2001

16

A low-frequency noise study of hot-carrier stressing effects in submicron Si p-MOSFETs

P Vasina, E Simoen, C Claeys, J Sikula

Journal:

Microelectronics Reliability

Année:

1998

Langue:

english

Fichier:

PDF, 215 KB

english, 1998

17

Anatomie comparée des Mammifères domestiques.Tome 6: Neurologie I:

Journal:

Anatomia, Histologia, Embryologia

Année:

2006

Fichier:

PDF, 46 KB

2006

18

A low-frequency noise study of gate-all-around SOI transistors

Simoen, E., Magnusson, U., Claeys, C.

Journal:

IEEE Transactions on Electron Devices

Année:

1993

Langue:

english

Fichier:

PDF, 601 KB

english, 1993

19

GIDL behavior of p- and n-MuGFET devices with different TiN metal gate thickness and high-k gate dielectrics

M. Galeti, M. Rodrigues, J.A. Martino, N. Collaert, E. Simoen, C. Claeys

Journal:

Solid-State Electronics

Année:

2012

Langue:

english

Fichier:

PDF, 591 KB

english, 2012

20

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Terahertz Physics, Devices, and Systems V: Advance Applications in Industry and Defense - Active THz imaging and explosive detection with uncooled antenna-coupled microbolometer arrays

Meilhan, J., Dupont, B., Goudon, V., Lasfargues, G., Lalanne Dera, J, Nguyen, D. T., Ouvrier-Buffet, J. L., Pocas, S., Maillou, T., Cathabard, O., Barbieri, S., Simoens, F., Anwar, Mehdi, Dhar, Nibir

Année:

2011

Langue:

english

Fichier:

PDF, 3.23 MB

english, 2011

21

A European perspective on the market accessibility of biosimilars

Declerck, Paul, Simoens, Steven

Journal:

Année:

2012

Langue:

english

Fichier:

PDF, 209 KB

english, 2012

22

A Survey of Authentication and Communications Security in Online Banking

Kiljan, Sven, Simoens, Koen, Cock, Danny De, Eekelen, Marko Van, Vranken, Harald

Journal:

ACM Computing Surveys

Année:

2016

Langue:

english

Fichier:

PDF, 1.29 MB

english, 2016

23

INTRODUCTION: COGNITIVE PERSPECTIVES ON DIFFICULTY AND COMPLEXITY IN L2 ACQUISITION

Housen, Alex, Simoens, Hannelore

Journal:

Studies in Second Language Acquisition

Année:

2016

Langue:

english

Fichier:

PDF, 149 KB

english, 2016

24

(Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETs

Veloso, Anabela, Paraschiv, Vasile, Vecchio, Emma, Devriendt, Katia, Li, Waikin, Simoen, Eddy, Chan, B. T., Tao, Zheng, Rosseel, Erik, Loo, Roger, Milenin, Alexey P., Kunert, Bernardette, Teugels, Lie

Journal:

ECS Transactions

Année:

2017

Langue:

english

Fichier:

PDF, 11.26 MB

english, 2017

25

(Invited) Gate-All-Around Nanosheet Field-Effect Transistors for Advanced Logic and Memory Applications: Integration and Device Features

Veloso, Anabela, Matagne, Philippe, Eneman, Geert, Mertens, Hans, Chasin, Adrian, Simoen, Eddy, Horiguchi, Naoto

Journal:

ECS Transactions

Année:

2020

Fichier:

PDF, 1.16 MB

2020

26

Low temperature behaviour of submicron accumulation mode p-channel SOI MOSFETs

A.L.P. Rotondaro, U. Magnusson, E. Simoen, C. Claeys, J-P. Colinge

Journal:

Microelectronic Engineering

Année:

1992

Langue:

english

Fichier:

PDF, 228 KB

english, 1992

27

SPICE modelling of hot-carrier degradation in Si1–xGex S/D and HfSiON based pMOS transistors

J. Martin-Martinez, E. Amat, M.B. Gonzalez, P. Verheyen, R. Rodríguez, M. Nafría, X. Aymerich, E. Simoen

Journal:

Microelectronics Reliability

Année:

2010

Langue:

english

Fichier:

PDF, 504 KB

english, 2010

28

Ion-implantation issues in the formation of shallow junctions in germanium

E. Simoen, A. Satta, A. D’Amore, T. Janssens, T. Clarysse, K. Martens, B. De Jaeger, A. Benedetti, I. Hoflijk, B. Brijs, M. Meuris, W. Vandervorst

Journal:

Materials Science in Semiconductor Processing

Année:

2006

Langue:

english

Fichier:

PDF, 361 KB

english, 2006

29

Effect of deep levels and interface states on the minority carrier lifetime control of trench-IGBTs by electron irradiation

M. Nakabayashi, H. Ohyama, H. Shitogiden, R. Ueno, Y. Miyagawa, T. Hirao, K. Shigaki, T. Kudou, E. Simoen, C. Claeys

Journal:

Physica B: Condensed Matter

Année:

2006

Langue:

english

Fichier:

PDF, 187 KB

english, 2006

30

Carrier lifetime dependence on doping, metal implants and excitation density in Ge and Si

E. Gaubas, J. Vanhellemont, E. Simoen, I. Romandic, W. Geens, P. Clauws

Journal:

Physica B: Condensed Matter

Année:

2007

Langue:

english

Fichier:

PDF, 229 KB

english, 2007

31

Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs

K. Hayama, K. Takakura, H. Ohyama, S. Kuboyama, S. Matsuda, J.M. Rafí, A. Mercha, E. Simoen, C. Claeys

Journal:

Microelectronics Reliability

Année:

2005

Langue:

english

Fichier:

PDF, 400 KB

english, 2005

32

Gate induced floating body effects in TiN/SiON and TiN/HfO2 gate stack triple gate SOI nFinFETs

J.M. Rafí, E. Simoen, A. Mercha, N. Collaert, K. Hayama, F. Campabadal, C. Claeys

Journal:

Solid-State Electronics

Année:

2007

Langue:

english

Fichier:

PDF, 3.86 MB

english, 2007

33

Hot-carrier stress effects on the amplitude of Random Telegraph Signals in small area Si p-MOSFETS

E. Simoen, C. Claeys

Journal:

Microelectronics Reliability

Année:

1997

Langue:

english

Fichier:

PDF, 403 KB

english, 1997

34

Large-eddy Simulation of the Dispersion of Solid Particles in a Turbulent Boundary Layer

Ivana Vinkovic, Cesar Aguirre, Michel Ayrault, Serge Simoëns

Journal:

Boundary-Layer Meteorology

Année:

2006

Langue:

english

Fichier:

PDF, 514 KB

english, 2006

35

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current transients

K. Hayama, K. Takakura, H. Ohyama, J. M. Rafí, A. Mercha, E. Simoen, C. Claeys

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2008

Langue:

english

Fichier:

PDF, 452 KB

english, 2008

36

Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs

J.M. Rafí, E. Simoen, K. Hayama, A. Mercha, F. Campabadal, H. Ohyama, C. Claeys

Journal:

Microelectronics Reliability

Année:

2006

Langue:

english

Fichier:

PDF, 517 KB

english, 2006

37

Influence of the sidewall crystal orientation, HfSiO nitridation and TiN metal gate thickness on n-MuGFETs under analog operation

M. Rodrigues, M. Galeti, J.A. Martino, N. Collaert, E. Simoen, C. Claeys

Journal:

Solid-State Electronics

Année:

2011

Langue:

english

Fichier:

PDF, 640 KB

english, 2011

38

Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle

H. Ohyama, E. Simoen, S. Kuroda, C. Claeys, Y. Takami, T. Hakata, K. Kobayashi, M. Nakabayashi, H. Sunaga

Journal:

Microelectronics Reliability

Année:

2001

Langue:

english

Fichier:

PDF, 409 KB

english, 2001

39

Radiation damages of polycrystalline silicon films and npn Si transistors by high-energy particle irradiation

H. Ohyama, M. Nakabayashi, E. Simoen, C. Claeys, T. Tanaka, T. Hirao, S. Onada, K. Kobayashi

Journal:

Microelectronics Reliability

Année:

2001

Fichier:

PDF, 335 KB

2001

40

Search and destroy policy for methicillin-resistant Staphylococcus aureus: cost-benefit analysis

Steven Simoens, Erik Ophals, Annette Schuermans

Journal:

Journal of Advanced Nursing

Année:

2009

Langue:

english

Fichier:

PDF, 129 KB

english, 2009

41

Radiation damage of N-MOSFETS fabricated in a BiCMOS process

K. Kobayashi, H. Ohyama, M. Yoneoka, K. Hayama, M. Nakabayashi, E. Simoen, C. Claeys, Y. Takami, H. Takizawa, S. Kohiki

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2001

Langue:

english

Fichier:

PDF, 433 KB

english, 2001

42

Processing factors influencing the leakage current in shallow junction diodes for deep submicro-meter CMOS

L. Grau, E. Augendre, E. Simoen, R. Rooyackers, C. Claeys, G. Badenes, A. Romano-Rodriguez

Journal:

Journal of Materials Science: Materials in Electronics

Année:

2001

Langue:

english

Fichier:

PDF, 521 KB

english, 2001

43

Observation of the dynamical Casimir effect in a superconducting circuit

Wilson, C. M., Johansson, G., Pourkabirian, A., Simoen, M., Johansson, J. R., Duty, T., Nori, F., Delsing, P.

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 321 KB

english, 2011

44

Low-frequency noise behavior of SiO2--HfO2 dual-layer gate dielectric nMOSFETs with different interfacial oxide thickness

Simoen, E., Mercha, A., Pantisano, L., Claeys, C., Young, E.

Journal:

IEEE Transactions on Electron Devices

Année:

2004

Langue:

english

Fichier:

PDF, 282 KB

english, 2004

45

Biosimilars and market access: a question of comparability and costs?

Steven Simoens, Gilbert Verbeken, Isabelle Huys

Journal:

Targeted Oncology

Année:

2012

Langue:

english

Fichier:

PDF, 105 KB

english, 2012

46

A comparative study of European rare disease and orphan drug markets

Alain Denis, Lut Mergaert, Christel Fostier, Irina Cleemput, Steven Simoens

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 129 KB

english, 2010

47

Nanobeam Diffraction: Technique Evaluation and Strain Measurement on Complementary Metal Oxide Semiconductor Devices

Favia, P., Bargallo Gonzales, M., Simoen, E., Verheyen, P., Klenov, D., Bender, H.

Journal:

Journal of The Electrochemical Society

Année:

2011

Langue:

english

Fichier:

PDF, 3.86 MB

english, 2011

48

On prediction error correlation in Bayesian model updating

Simoen, Ellen, Papadimitriou, Costas, Lombaert, Geert

Journal:

Journal of Sound and Vibration

Année:

2013

Langue:

english

Fichier:

PDF, 766 KB

english, 2013

49

Advantages of different source/drain engineering on scaled UTBOX FDSOI nMOSFETs at high temperature operation

Nicoletti, Talitha, Santos, Sara Dereste dos, Martino, João Antonio, Aoulaiche, Marc, Veloso, Anabela, Jurczak, Malgorzata, Simoen, Eddy, Claeys, Cor

Journal:

Solid-State Electronics

Année:

2014

Langue:

english

Fichier:

PDF, 786 KB

english, 2014

50

Health economics of market access for biopharmaceuticals and biosimilars

Simoens, Steven

Journal:

Journal of Medical Economics

Année:

2009

Langue:

english

Fichier:

PDF, 231 KB

english, 2009